ELECTRON MICROSCOPY OF SILICON MONOPHOSPHIDE PRECIPITATES IN P-DIFFUSED SILICON.SERVIDORI M; ARMIGLIATO A.1975; J. MATER. SCI.; G.B.; DA. 1975; VOL. 10; NO 2; PP. 306-313; BIBL. 10 REF.Article

METODI LITOGRAFICI PER LA TECNOLOGIA PLANARE. I. LITOGRAFIA OTTICA, A RAGGI X, ELETTRONICA A PROIEZIONE. = METHODES LITHOGRAPHIQUES POUR LA TECHNOLOGIE PLANAIRE. PHOTOLITHOGRAPHIE, LITHOGRAPHIE AUX RAYONS X, LITHOGRAPHIE PAR PROJECTION D'ELECTRONSARMIGLIATO A; COCITO M; MERLI PG et al.1977; ELETTRON. E TELECOMUNIC.; ITAL.; DA. 1977; VOL. 26; NO 2; PP. 67-80; ABS. ANGL.; BIBL. 36 REF.Article

LOW ANGLE ELECTRON DIFFRACTION WITH THE ELMISKOP 101 ELECTRON MICROSCOPEARMIGLIATO A; MERLI PG; RUFFINI G et al.1973; J. PHYS. E; G.B.; DA. 1973; VOL. 6; NO 1; PP. 35-39; BIBL. 11 REF.Serial Issue

DETECTION OF ULTRA-SOFT X-RAYS WITH A VARIABLE GEOMETRY PROPORTIONAL COUNTER FITTED TO A TRANSMISSION ELECTRON MICROSCOPE (TEM).ARMIGLIATO A; BENTINI GG; RUFFINI G et al.1976; J. MICR.; G.B.; DA. 1976; VOL. 108; NO 1; PP. 31-39; BIBL. 11 REF.Article

LOW ANGLE ELECTRON DIFFRACTION WITH THE ELMISKOP 101 ELECTRON MICROSCOPEARMIGLIATO A; MERLI PG; RUFFINI G et al.1973; J. PHYS. E; G.B.; DA. 1973; VOL. 6; NO 1; PP. 35-39; BIBL. 11 REF.Serial Issue

Simultaneous determination of composition and thickness of thin films by X-ray microanalysis at 300 kV and monte carlo simulationARMIGLIATO, A; ROSA, R.Ultramicroscopy. 1990, Vol 32, Num 2, pp 127-136, issn 0304-3991, 10 p.Article

On the epitaxial relationships of TiSi₂ on siliconNIPOTI, R; ARMIGLIATO, A.Japanese journal of applied physics. 1985, Vol 24, Num 11, pp 1421-1424, issn 0021-4922Article

Electron microscopy characterization of monoclinic SiAs precipitates in heavily As⁺-implanted siliconARMIGLIATO, A; PARISINI, A.Journal of materials research. 1991, Vol 6, Num 8, pp 1701-1710, issn 0884-2914Article

Analytical electron microscopy of Al/TiN contacts on silicon for applications to very large scale integrated devicesARMIGLIATO, A; VALDRE, G.Journal of applied physics. 1987, Vol 61, Num 1, pp 390-396, issn 0021-8979Article

High resolution electron microscopy observations of precipitates in P-supersaturated siliconARMIGLIATO, A; WERNER, P.Ultramicroscopy. 1984, Vol 15, Num 1-2, pp 61-69, issn 0304-3991Article

ROLE OF A POLYSILICON LAYER IN THE REDUCTION OF LATTICE DEFECTS ASSOCIATED WITH PHOSPHORUS PREDEPOSITION IN SILICONARMIGLIATO A; SERUIDORI M; SOLMI S et al.1980; J. MATER. SCI.; ISSN 0022-2461; GBR; DA. 1980; VOL. 15; NO 5; PP. 1124-1130; BIBL. 17 REF.Article

APPLICATIONS OF MONTE CARLO TECHNIQUE TO THE ELECTRON PROBE MICROANALYSIS OF TERNARY SI-B-O FILMS ON SILICONARMIGLIATO A; DESALVO A; RINALDI R et al.1979; J. PHYS. D; ISSN 0022-3727; GBR; DA. 1979; VOL. 12; NO 8; PP. 1299-1308; BIBL. 17 REF.Article

X-RAY MICROANALYSIS OF NITROGEN IN PRESENCE OF TITANIUM WITH AN AUTOMATED ELECTRON MICROPROBEARMIGLIATO A; DORI L; GARULLI A et al.1982; JOURNAL DE MISCROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES; ISSN 0395-9279; FRA; DA. 1982; VOL. 7; NO 6; PP. 593-603; BIBL. 14 REF.Article

IN THE GROWTH OF STACKING FAULTS AND DISLOCATIONS INDUCED IN SILICON BY PHOSPHORUS PREDEPOSITION.ARMIGLIATO A; SERVIDORI M; SOLMI S et al.1977; J. APPL. PHYS.; U.S.A.; DA. 1977; VOL. 48; NO 5; PP. 1806-1812; BIBL. 23 REF.Article

ISOCHRONAL ANNEALING OF SILICON-PHOSPHORUS SOLID SOLUTIONS.OSTOJA P; NOBILI D; ARMIGLIATO A et al.1976; J. ELECTROCHEM. SOC.; U.S.A.; DA. 1976; VOL. 123; NO 1; PP. 124-129; BIBL. 26 REF.Article

CHARACTERIZATION OF TITANIUM NITRIDE FILMS DEPOSITED ONTO SILICONARMIGLIATO A; CELOTTI G; GARULLI A et al.1982; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1982; VOL. 92; NO 4; PP. 341-346; BIBL. 15 REF.Article

DETERMINATION OF COMPOSITION AND THICKNESS OF TIN_XOY FILMS ON SILICON BY COMBINED X-RAY AND NUCLEAR MICROANALYSISARMIGLIATO A; GARULLI A; ROSA R et al.1983; X-RAY SPECTROMETRY; ISSN 0049-8246; GBR; DA. 1983; VOL. 12; NO 1; PP. 38-41; BIBL. 17 REF.Article

PROPERTIES OF TIN OBTAINED BY N₂⁺-IMPLANTATION ON TI-COATED SI WAFERS = PROPRIETES DE TIN OBTENU PAR IMPLANTATION DE N₂⁺ SUR DES PASTILLES DE SI REVETUES DE TIARMIGLIATO A; CELOTTI G; GARULLI A et al.1982; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1982; VOL. 41; NO 5; PP. 446-448; BIBL. 14 REF.Article

Determination of bulk mismatch values in transmission electron microscopy cross-sections of heterostructures by convergent-beam electron diffractionBALBONI, R; FRABBONI, S; ARMIGLIATO, A et al.Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties. 1998, Vol 77, Num 1, pp 67-83, issn 1364-2804Article

Numerical simulation of the landslide-induced tsunami of 1988 on Vulcano Island, ItalyTINTI, S; BORTOLUCCI, E; ARMIGLIATO, A et al.Bulletin of volcanology (Print). 1999, Vol 61, Num 1-2, pp 121-137, issn 0258-8900Article

Thin film X-ray microanalysis with the analytical electron microscopeARMIGLIATO, A.Journal of analytical atomic spectrometry (Print). 1999, Vol 14, Num 3, pp 413-418, issn 0267-9477Conference Paper

Contrast of small SiX particles in silicon by computed HREM imagesARMIGLIATO, A; BOURRET, A; FRABBONI, S et al.Physica status solidi. A. Applied research. 1988, Vol 109, Num 1, pp 53-60, issn 0031-8965Article

Computer simulation of high resolution electron microscopy images of small precipitates in P-supersaturated siliconARMIGLIATO, A; PARISINI, A; HILLEBRAND, R et al.Physica status solidi. A. Applied research. 1985, Vol 90, Num 1, pp 115-126, issn 0031-8965Article

Boron and antimony codiffusion in siliconMARGESIN, B; CANTERI, R; SOLMI, S et al.Journal of materials research. 1991, Vol 6, Num 11, pp 2353-2361, issn 0884-2914Article

Magnetic measurements and transmission electron microscopy investigations on Fe-Co ultrafine powders derived from a bimetallic carbonyl clusterPREDIERI, G; PARETI, L; SOLZI, M et al.Journal of material chemistry. 1994, Vol 4, Num 2, pp 361-364, issn 0959-9428Article